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Ron@Maltiel-consulting.com
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Semiconductor & Patent Expert Consulting IP Litigation expert consultant and patent expert witness for process, device, and circuit of DynamicRam (DRAM), Flash (NAND, NOR, EEPROM), and Static Ram (SRAM) Memories,and Microprocessor, Logic, and Analog Devices |
News articles - Intel, IBM, NEC announce Hi-k, Metal gate Breakthrough1. Intel and IBM give Moore's Law a boost2. Intel tips high-k, metal gates for 45-nm3. Intel tips 45-nm process, demos chips4. IBM and partners tip high-k, metal gates5. NEC offers platform for cell-based ICs6. NEC says 55-nm process cuts power consumption
Intel and IBM give
Moore's Law a boost Michael McManus, DigiTimes.com, Taipei [Sunday
28 January 2007]
Intel tips high-k, metal gates for 45-nm
The company claims to be one of the first chip makers to implement these new materials in its process technology. Using an undisclosed thick hafnium-based material for its high-k films in gate-stack applications, Intel claims that it is able to boost the overall performance, while also reducing transistor leakage by more than 10 times over current silicon dioxide technology. Seeking to get a jump on its rivals, Intel (Santa Clara, Calif.) (see below- Intel tips 45-nm process, demos chips) disclosed the initial details of its 45-nm process and claimed it had produced the world's first chips based on the technology. Intel's 45-nm process, dubbed P1266, is said to incorporate copper interconnects, low-k dielectrics, strained silicon and other features. At the time, the company did not disclose if it would deploy silicon dioxide or high-k dielectric films for the critical gate stack. Now, Intel said it will use a new material with a property called high-k, for the transistor gate dielectric, and a new combination of metal materials for the transistor gate electrode. ''The implementation of high-k and metal materials marks the biggest change in transistor technology since the introduction of polysilicon gate MOS transistors in the late 1960s,'' said Intel co-founder Gordon Moore, in a statement. ''As more and more transistors are packed onto a single piece of silicon, the industry continues to research current leakage reduction solutions,'' said Mark Bohr, Intel senior fellow, in the same statement. ''Our implementation of novel high-k and metal gate transistors for our 45-nm process technology will help Intel deliver even faster, more energy efficient multi-core products that build upon our successful Intel Core 2 and Xeon family of processors, and extend Moore's Law well into the next decade.'' NEC Corp. is moving high-k into production, while IBM Corp. has disclosed the technology as well. Intel tips 45-nm process, demos chips Compared to its 65-nm process, Intel (Santa Clara, Calif.) claims that its new 45-nm technology has a two-fold improvement in transistor density, a 20-percent jump in switching speeds and a 30-percent reduction in power. Since late last year, Intel has been shipping microprocessors based on its 65-nm process. In contrast, microprocessor rival Advanced Micro Devices Inc.
recently signed a technology license for "floating-body"
silicon-on-insulator (SOI) memory developed by startup company Innovative
Silicon Inc. AMD (Sunnyvale, Calif.) said it is interested in the Z-RAM
(zero capacitor) technology for use in its microprocessors.
Intel and AMD are preparing to square off again in the x86-based
processor market with next-generation products, which are due out in 2006.
Intel recently outlined its strategy to fend off competitive
pressures from AMD, especially at the 65-nm node. At an event, Intel
reannounced its roadmap of dual-core mobile, desktop and server processors
at the 65-nm node. The company also claimed that it will have no less than
four wafer fabs in its arsenal that will manufacturer chips based on the
65-nm process.
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IBM and partners tip high-k, metal gates Working with Advanced Micro Devices Inc. and its other development partners, Sony Corp. and Toshiba Corp., IBM has found a way to construct a critical part of the transistor with a new high-k/metal gate material, clearing a path toward chip circuitry that is smaller, faster and more power-efficient than previously possible. The high-k and metal gate substitutes a new material into a critical portion of the transistor that controls its primary on/off switching function. The material provides superior electrical properties compared to its predecessor, enhancing the transistor's function while also allowing the size of the transistor to be shrunk beyond limits being reached today. The technology can be incorporated into existing chip manufacturing lines with minimal changes to tooling and processes, making it economically viable. IBM has inserted the technology into its state-of-the-art semiconductor manufacturing line in East Fishkill, N.Y. and will apply it to products with chip circuits as small as 45-nm starting in 2008. NEC Corp. is moving high-k into production, while Intel Corp. has disclosed the technology as well. |
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NEC offers platform for cell-based ICs NEC introduced high-k film in the volume production process. "We are preceding competitors by a half step," claimed Hiroshi Iguchi, vice president of NEC's 1st Systems Operations Unit. NEC wants to expand sales of cell-based ICs from the current ¥75 billion (about $625 million) to ¥120 billion ($1 billion) by 2010 based on sales related to the CB-55L platform. CB-55L is based on NEC Electronics' UX7LS CMOS process technology, which the company claims is the first 55-nm process to utilize a high-k dielectric. The introduction of the high-k dielectric would reduce leakage current to one-fourth and would improve total power consumption by 40 percent over the previous 90-nm generation introduced in 2002. Power consumption for the CB-55 is 1.7 nano-watt/MHz/gate. The use of (see below - NEC says 55-nm process cuts power consumption) makes it possible to increase gate density by 230 percent, enabling 925,000 gates per square millimeter. The maximum number of gates that can be integrated on a chip is 100 million, and the maximum number of I/Os is 2,800. Power supply voltage is 1-1.2V internally and I/O at 1,8V, 2.5V and 3.3V. The maximum system frequency is 450 MHz with 1.2V power supply and 233 MHz with 1.0V supply. NEC will drop the high-speed version and intends to cover middle and low power types with the CB-55L. "At present, we have no intention to develop the high-speed type. It accounts for just less than 10 percent of the total CB-90 sales. We want to concentrate on the low-power type aiming at portable devices," Iguchi said. NEC will provide IP macros such as USB2.0, JPEG, DDR/DDR2 focusing on targeted applications such as digital cameras, camcorders and other battery-operated applications. It will also offer commodity IPs, including PLLs, A/D converters and D/A converters. The library will be available in March. When NEC Electronics announced its UX7LS in November 2005, the company said immersion lithography technology would be used for critical processes. But Iguchi said CB-55L can still use dry process technology. |
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NEC says 55-nm process cuts power consumption "UX7LS is an improved version of the 65-nm process. By combining with the 65-nm process technology with high-k film, we've developed the ultimate low power LSI," said Takaaki Kuwata, general manager of Advanced Device Development Division of the company. "The process will be applicable to LSIs for products from mobile phones, mobile consumer products to network systems," he said. NEC Electronics had disclosed a 65-nm process named UX7, which employs conventional dry lithography and a transistor structure without high-k technology. Engineering samples of both high speed and low power versions will be available by the middle of next year. "Just by scaling down to 55-nm, the power consumption can not be lowered," said Kuwata. "Our Ultimate Low Power technology, including the Vdd (source voltage)/Vth (threshold voltage) control and high-k technology realized low power consumption." The NEC Electronics team used the combination of body-bias sensitive device structure to control transistor threshold voltage and high-k (HfSiON) gate insulating film to realize the low power devices. The high-k gate insulator film is grown on the conventional SiO2 layer at the gate. The high-k insulator layer is equal to 1.8nm thick SiO2 layer. "We can supply the highest density and smallest SRAM around 2007 to 2008, which will be the most advanced device until the 45-nm node products become available on the market," said Kuwata. The SRAM on the UX7LS process will have a gate density of 925,000 gates per square millimeter and cell size of 0.432 square microns. The company intends to offer samples in summer 2007 and begin volume production within the year. It is an advantage that most 65-nm production facilities can be used for the 55-nm process, said Kuwata. Only for critical processes will they use the emersion lithography system. ASML will supply the emersion lithography system for sample fabrication and pilot production. The volume production system has not yet been decided, according to Kuwata. The first metal layer will have a 180-nm pitch. NEC Electronics announced the joint development agreement with Toshiba for the 45-nm node and beyond technologies. The UX7LS technology will eventually be merged into the jointly developed process, tentatively designated UX8. Based on the joint 45-nm process, NEC Electronics will continue developing differentiated technologies such as embedded DRAM independent from its partner, according to Kuwata.
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