Semiconductor Consulting and Expert Witness Services

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Semiconductor Consulting

• Expert consultant

• Expert witness

• Patent litigation

• Circuits, Processes (CMOS, BICMOS)

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• Flash memory (NAND or NOR)

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  Bio

Ron Maltiel is a litigation expert consultant and patent expert witness with more than 20 years experience in all phases of design,  process implementation, and consulting in semiconductor process, device, and circuit. He has worked in the semiconductor field in the development and production of various product types such as Dynamic Ram  Memory (DRAM), Flash Memory (NAND, NOR, EEPROM, HDD or SSD), and Static Ram Memory (SRAM) memories used for microprocessor and logic, digital, and Analog devices.

Ron holds more than half a dozen patents that have been cited more than 100 times. His patents cover varied areas of semiconductor device, circuit, process, and measurements.

Ron studied semiconductors at Stanford University graduate school and developed new semiconductor processes and devices at Intel, AMI, Advanced Micro Devices (AMD), and Maxim Integrated Products. He has served as an expert consultant and expert witness in close to 20 US and International Patent litigations and is experienced in supporting patents and trade secrets litigation. He is also fluent in Hebrew.

Client Testimonials 

Jury members stated that Maltiel was a more believable expert witness than the opposing expert witness following  a successful decision in a recent multi million dollar litigation.

A trial observer stated "Ron Maltiel was a very competent, authoritative and tough witness".

"Maltiel is diligent and enthusiastic about his assignments. We plan to use him again. "

"Ron is accessible, fast and accurate. He knows to ask the right questions and does a thorough, top-notch job. I would not hesitate to use Ron's services again."

"Ron is very professional and responsive. We will hire him again. He was great!"

(based on anonymous feedback provided from clients' survey done by www.prosavvy.com )

Semiconductor Patents Held:

• Electrical measurements of profile of semiconductor devices during their manufacturing process - #4,978,923

• Method and apparatus for non-destructive data in a shadow memory array - #4,716,552

• Electrical measurements of properties of semiconductor devices during their manufacturing process - # 4,956,611

• Memory cell providing simultaneous non-destructive access to volatile and non-volatile data - #4,672,580

• Non-volatile dynamic ram cell - #4,611,309

• Gold-doped IC resistor region - #4,432,008