#4,978,923

Electrical measurements of profile of semiconductor devices during their manufacturing process.

#4,672,580

Memory cell providing simultaneous non-destructive access to volatile and non-volatile data.

#4,956,611

Electrical measurements of properties of semiconductor devices during their manufacturing process.

#4,611,309

Non-volatile dynamic ram cell.

#4,716,552

Method and apparatus for non-destructive data in a shadow memory array.

#4,432,008

Gold-doped IC resistor region.